Surface acoustic wave sensors

ABSTRACT

Pressure sensing diaphragms comprise a cylindrical or spherical crystalline member in which an internal cylindrical or spherical chamber is provided. In the internally loaded embodiments, a fluid is introduced into the chamber and the pressure exerted by the fluid causes generally tensile stress in the region of the diaphragm generally about the chamber. In the externally loaded embodiments, the diaphragm is immersed within the fluid and the pressure exerted by the fluid causes generally compressive stress in the region of the diaphragm generally about the chamber. For each of the embodiments, the stresses arising cause certain mechanical and electrical properties of the crystalline material to change. The change in these properties is detected by observing the frequency behavior of one or more oscillators whose frequencies of operation are controlled by respective surface acoustic wave devices provided in the regions of elastic deformation. Many diaphragm arrangements are capable of providing temperature compensated pressure measurements. Two particularly useful orientations for the temperature compensated embodiments are the SST and ST orientations.

This is a division of application Ser. No. 427,240, filed Sept. 29,1982.

BACKGROUND OF THE INVENTION

The present invention relates generally to sensors for measuring forcesemploying surface acoustic waves, and more particularly to highly stableand sensitive hydrostatic pressure sensors, suitable for high pressureapplications, employing surface acoustic waves.

Sensors employing surface acoustic wave (hereinafter "SAW") devices suchas delay lines and resonators are known for measuring accelerations,stresses and strains, and pressure. These sensors generally are based onthe propagation of surface acoustic waves across a thin, flexiblediaphragm which is deformed when subjected to an applied acceleration,stress or strain, or pressure. The surface acoustic wave delay time is afunction of the applied external acceleration, stress or strain, orpressure, since the wave velocity and path length vary with diaphragmdeformation. The change in surface acoustic wave propagationcharacteristics is measured as a change in the frequency of oscillationof external oscillator circuitry connected in series with the SAW devicein a regenerative feedback loop. U.S. Pat. No. 3,978,731, issued Sept.7, 1976 to Reeder et al and U.S. Pat. No. 3,863,497, issued Feb. 4, 1975to van de Vaart et al. disclose such SAW sensors.

Several approaches to making the pressure-sensitive diaphragm of a SAWsensor are known. A sensor having piezoelectric transducers deposited bythin film techniques on a steel beam is disclosed in U.S. Pat. No.4,107,626, issued Aug. 15, 1978 to Kiewit. A sensor having dualsubstrates, a SAW substrate and a base substrate, of the same materialand orientation bonded to one another is disclosed in U.S. Pat. No.4,216,401, issued Aug. 5, 1980 to Wagner. Such sensors have severelyrestricted operating characteristics or are subject to deterioratingperformance or actual failure due to limitations of the bond.

A pressure-sensitive diaphragm may also be formed by boring or drillinga central cavity in the SAW substrate, as disclosed for example in U.S.Pat. No. 4,100,811, issued July 18, 1978 to Cullen et al. While thisapproach avoids the use of a bond in the sensitive region, bored ordrilled diaphragms of this type are not readily fabricated to a desiredthickness or to a very thin thickness, or with parallel membranesurfaces. Additionally, sharp and deep corners are encountered whichlead to stress concentrations which limit such sensors to low pressureapplications.

A cylindrical pressure sensing diaphragm which avoids some of thedifficulties mentioned above is disclosed in a U.S. Pat. No. 3,878,477,issued Apr. 15, 1975 to Dias et al. Respective end caps are provided toadmit a fluid into the interior of the diaphragm to effect the pressuremeasurement. Such a cylindrical diaphragm is disadvantageous, however,in that variations in temperature adversely affect the pressuremeasurement.

In general, sensors utilizing SAW devices, including the cylindricalpressure sensing diaphragm of the Dias et al patent, are adverselyaffected by temperature variations. Such SAW devices generally comprisea SAW substrate of such piezoelectric materials as quartz, lithiumniobate, and lithium tantalate, or a composite treated substrate such assilicon having a suitable thin film coating of piezoelectric materialsuch as zinc oxide, all of which exhibit sufficient acousto-electriccoupling to provide a measurable variation in surface acoustic wavepropagation velocity in response to variations in the subsurface strainthereof. Since these materials are sensitive to strain-related phenomenawhich include temperature as well as stress and acceleration, pressuresensors either must include means for compensating for temperaturevariations or be operated at a given temperature or over a narrow giventemperature range if a temperature compensated orientation such as theST cut ((yxwl) 0°/42.75°) or the SST cut ((yxwl) 0°/-49.22°, propagationdirection of 23° from the diagonal axis) is used.

Some techniques for compensating for temperature variations in varioustypes of sensors are known. The aforementioned Kiewit patent discloses atemperature compensation technique in which surface acoustic wavestravel in adjacent regions of essentially the same generally planarsurface so that the effect of temperature variations on the respectiveregions is substantially equal. With force applied to the sensor, adifference frequency obtained by mixing the outputs of the respectiveoscillators associated with the regions, one of which is in compressionand the other of which is in tension, is proportional to the deflectionof the beam within its elastic limits. The aforementioned Dias et alpatent discloses a temperature compensation technique in which dualacoustic surface wave oscillators coupled to a single generally planarsubstrate of piezoelectric material inversely change their respectivefrequencies in response to a force applied normal to the surface of thesubstrate. The aforementioned Reeder et al patent discloses atemperature compensation technique in which the two acoustic channels ofthe sensor are fabricated close together on the same substrate of agenerally planar diaphragm so that their temperature difference willtend to be small. One of the channels is a primary, or measurementchannel, and the other is a reference channel. The reference channelpressure is held constant so that the output of the measurement channel,after being mixed with the output of the reference channel, is a guageof the absolute pressure. U.S. Pat. No. 3,886,484, issued May 27, 1975to Dias et al. discloses devices in which two delay lines, one having arotated Y cut of θ=42.75° and the other having a rotated Y cut of R=35°,are cascaded to provide a broader temperature range of stable operation.U.S. Pat. No. 3,999,147, issued Dec. 21, 1976 to Otto et al., disclosesan acoustic wave device having reflective gratings combined with amaterial such that the temperature coefficients of delay along differentdirections are of opposite sign. The acoustic wave is propagated alongsuitable path lengths to provide a linear zero temperature coefficientof delay.

SUMMARY OF THE INVENTION

An object of the present invention, therefore, is to provide sensingdiaphragms suitable for the measurement of pressure and relatedphenomena which overcome various of the disadvantages identified above.Accordingly, the objects of the present invention include providing apressure sensing diaphragm which is capable of providing accurateoperation over a wide range of temperatures, or high accuracy, or highresolution, or fast response time, or a high dynamic range of operation,or good short-term frequency stability, or good aging characteristics,or various combinations of the foregoing.

A pressure sensing diaphragm in accordance with the present inventioncomprises a cylindrical or spherical piezoelectric member in which aninternal cylindrical or spherical chamber is provided. In the internallyloaded embodiments, a fluid is introduced into the chamber and pressureexerted by the fluid causes generally tensile stress in the region ofthe diaphragm generally about the chamber. In the externally loadedembodiments, the diaphragm is immersed within the fluid and pressureexerted by the fluid causes generally compressive stress in the regionof the diaphragm generally about the chamber. These stresses causemechanical and electrical properties of the piezoelectric material tochange. The change in these properties is detected by observing thefrequency behavior of one or more oscillators whose frequencies ofoperation are controlled by respective surface acoustic wave ("SAW")devices provided in the regions of elastic deformation.

Ideally, orientations for use in pressure sensing applications should behighly sensitive to force effects and insensitive to temperature effectsover a broad range of temperatures and pressures. Unfortunately, evensuch temperature compensated orientations as the ST cut ((yxwl)0°/42.75°) and the SST cut ((yxwl) 0°/-49.22°, propagation direction of23°) do not meet these requirements. Advantageously, therefore, thepresent invention includes various diaphragm arrangements capable ofproviding pressure measurements over ranges of temperature. Arrangementsare described for self temperature compensation, weighted temperaturecompensation, measurement correction, and combinations thereof.

Other objects, features, and characteristics of the invention willbecome apparent upon consideration of the following Detailed Descriptionand the appended Claims, with reference to the accompanying Drawings,all of which are part of this Specification.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings, wherein like reference characters indicate like parts:

FIG. 1 is a perspective view of an internally loaded pressure sensingdiaphragm;

FIGS. 2 and 3 are cross-sectional views of the internally loadedpressure sensing diaphragm of FIG. 1, taken respectively along the axisof the diaphragm and in a plane perpendicular to the axis of thediaphragm;

FIGS. 4 and 5 are cross-sectional views of an externally loaded pressuresensing diaphragm, taken respectively along the axis of the diaphragmand in a plane perpendicular to the axis of the diaphragm;

FIG. 6 is a schematic diagram of an electrical circuit suitable forobtaining pressure measurements from the sensing diaphragms shown inFIGS. 1-3 and 4-5;

FIG. 7 is a perspective view of an internally loaded pressure sensingdiaphragm principally for self temperature compensation;

FIGS. 8 and 9 are cross-sectional views of the internally loadedpressure sensing diaphragm of FIG. 7, taken respectively along the axisof the diaphragm and in a plane perpendicular to the axis of thediaphragm;

FIGS. 10 and 11 are cross-sectional views of a housing and of theinternally loaded pressure sensing diaphragm of FIG. 7 as installedtherein, taken respectively along the axis of the diaphragm and in aplane perpendicular to the axis of the diaphragm;

FIGS. 12 and 13 are cross-sectional views of an externally loadedpressure sensing diaphragm principally for self temperaturecompensation, taken respectively along the axis of the diaphragm and ina plane perpendicular to the axis of the diaphragm;

FIGS. 14 and 15 are cross-sectional views of a housing and of theexternally loaded pressure sensing diaphragm of FIGS. 12 and 13 asinstalled therein, taken respectively along the axis of the diaphragmand in a plane perpendicular to the axis of the diaphragm;

FIG. 16 is a schematic diagram of an electrical circuit suitable forobtaining a measurement of pressure from the pressure sensing diaphragmsshown in FIGS. 7-11 and 12-15;

FIG. 17 is a perspective view of a raw quartz crystal illustrating thecoring of a quartz cylinder of a given orientation therefrom;

FIG. 18 is a schematic diagram illustrating the location of flats ofselected crystallographic orientations on the quartz cylinder of FIG.17;

FIGS. 19 and 20 are cross-sectional views of another embodiment of anexternally loaded pressure sensing diaphragm principally for selftemperature compensation, taken respectively along the axis of thediaphragm and in a plane perpendicular to the axis of the diaphragm;

FIGS. 21, 22 and 23 are cross-sectional views of various additionalembodiments of internally loaded pressure sensing diaphragm principallyfor self temperature compensation, taken along in a plane perpendicularto the axis of the diaphragms;

FIG. 24 graphically shows an illustrative Δf/fΔT as a function oftemperature for the ST-X and SST orientations in temperatureuncompensated and self temperature compensated arrangements, forexplaining weighting-type temperature compensation;

FIG. 25 is a graphical illustration of one possible weighting functionfor use in the weighting-type temperature compensation;

FIGS. 26 and 27 are cross-sectional views of an internally loadedpressure sensing diaphragm principally for measurement correction-typetemperature compensation, taken respectively along the axis of thediaphragm and in a plane perpendicular to the axis of the diaphragm;

FIG. 28 is an enlargement of a flat representative of the flats providedon the embodiments of FIGS. 26-27 and 29-30;

FIGS. 29 and 30 are cross-sectional views of an externally loadedpressure sensing diaphragm principally for measurement correction-typetemperature compensation, taken respectively along the axis of thediaphragm and in a plane perpendicular to the axis of the diaphragm;

FIG. 31 is a schematic diagram of an electrical circuit suitable forobtaining a measurement of pressure from the pressure sensing diaphragmsshown in FIGS. 26-27 and 29-30;

FIG. 32 is a perspective view of an externally loaded spherical pressuresensing diaphragm; and

FIG. 33 is a cross-sectional view of the externally loaded pressuresensing diaphragm of FIG. 32, taken along a diameter thereof.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

General considerations pertaining to the sensing diaphragms of thepresent invention are discussed with reference to the internally loadedembodiment of FIGS. 1-3 and to the externally loaded embodiment of FIGS.4-5. The novel sensing diaphragms of the present invention, bothexternally and internally loaded, are particularly well suited for thesensing of pressure and can be adapted for the sensing of relatedphenomena such as force and acceleration. The novel sensing diaphragmsof the present invention should operate to sense hydrostatic pressure,for example, over a range of 0 psi to 8,000 psi and in some embodimentsto as high as 30,000 psi or better, over a temperature range of 0° C. to100° C. and in some embodiments to as high as 275° C. or better, withhigh resolution on the order of 0.01 psi or better, high accuracy on theorder of 0.025% full scale or better, fast response time on the order of10 seconds or better, broad dynamic range on the order of 10⁶ or better,good short-term frequency stability on the order of Δf/f=10⁻¹⁰ over aone second gate time or better, and good aging characteristics due togood long-term frequency stability on the order of Δf/f=10⁻⁶ /year orbetter. Principles of operation and suitable pressure housings andsuitable electronic circuitry are described.

In the internally loaded embodiment of FIGS. 1-3, a cylindrical member1, preferably of quartz, is provided with two longitudinal flats 2a and2b milled into the outside surface of cylinder 1 preferably but notnecessarily opposite one another such that flats 2a and 2b lie inrespective parallel planes. Each flat 2a and 2b is milled to the depthr₁. Although only a single flat is necessary, the use of two identicallymilled opposite flats provides mechanical symmetry and has otheradvantages, as explained below. A bore 4 is made in cylinder 1, the axesof bore 4 and cylinder 1 being coincident. The various structuralfeatures of the diaphragm of FIGS. 1-3 and of the other internallyloaded embodiments described herein, unless otherwise specified, may bedimensioned as follows, although the dimensions, which are a function ofthe type of material used, the type of SAW devices employed in thestructure, the propagation direction of the surface acoustic wave energywhich determines the location of the SAW devices, and the specificationsof the pressure sensor, may be optimized for specific applications. Thecylinder 1 may have a diameter "D" of 26 mm and a length "L" of 35 mm.Each flat 2a and 2b may have a width of 14 mm and a length of 21 mm. Thebore 4 may have a diameter of 10 mm. The milling depth r₁ may be 2 mm.The location of the bore 4 and the depth r₁ to which each flat is milledestablishes the thicknesses t₁, which may be 6 mm.

The dimensions given above and throughout this Specification for theinternally and externally loaded embodiments define illustrativecombinations of dimensions suitable for high pressure diaphragms. Thechoice of dimensions is a compromise between such concerns as reducingthe thermal mass of the structure while maintaining a comparativelylarge surface area per unit mass for, e.g., quick equilibration oftemperature gradients; achieving structural strength for high pressureoperation; and accomodating the requirements for fabrication andperformance of the SAW devices used. In the illustrative dimensionsgiven above for the internally loaded embodiment, for example, a milledflat measuring 14 mm by 21 mm was provided to minimize the physical massof the diaphragm and the hysteresis in the active area of the flat whileproviding adequate strength. The area required by the SAW device alone,however, is as little as 2 mm by 10 mm or smaller, depending onfrequency of operation.

The diaphragms of this and the other embodiments described herein, bothinternally and externally loaded, preferably are made from a singlepiece of elastic, piezoelectric material. Quartz is characterized by oneof the lowest acoustic losses among available piezoelectric materials, anecessary requirement for good short/medium term stability of a crystalcontrolled oscillator. Defining an acoustic quality factor Q to be aratio Δ of the energy loss per unit volume per cycle and the elasticenergy stored per unit volume per cycle, the Q of quartz can beexpressed as Q⁻¹ =Δ/2π at a particular temperature and frequency,meaning that the acoustic loss is inversely proportional to the velocityof the propagating acoustic waves. The product of Q and frequency (incycles per second) is approximately equal to 10¹³ for surface waves inquartz. A high purity quartz material of superior quality (preferablypremium or optical grade quartz) should be selected. Other suitablepiezoelectric materials include lithium niobate, lithium tantalate, andcomposite treated substrates such as silicon having a suitable thin filmcoating of piezoelectric material such as zinc oxide. In the cylindricalembodiments, the dominant stress occurring is the hoop stress, which ismuch larger than the axial stress.

The structural features and selected dimensions of the various diaphragmembodiments described herein should result in a sensor having a veryhigh Q, on the order of about 40,000 at 200 MHz as measured in a vacuum.For example, the sections of cylinder 1 adjacent flats 2a and 2b areprimarily affected by the introduction of a fluid into the bore 4 andelastically deform in response to the force exerted by the fluid. Thesesections are well isolated from the ends of the diaphragm, which resultsin an efficient coupling of the force and the high Q of the sensor. Theelastic deformation of these sections is detected as a change in thefrequency of associated oscillator circuits, as described below.

SAW devices having desired operating characteristics are fabricatedpreferably on milled flats, although other surface contours arepossible. For example, the SAW device and propagation path may both beassociated with a curved surface, the SAW device may be fabricated onflat surfaces with a portion of the propagation path over a curedsurface, or the SAW device may be fabricated on curved surfaces with aportion of the propagation path over a flat. Moreover, the SAW devicemay lie on a flat which appears to be a secant when viewing thediaphragm in section, or may be in an angular or curvilinear channel ora notch suitably made in the diaphragm. The sharp regions of the flat,channel, or notch may be smoothed to the degree desired to avoid theconcentration of stress that might otherwise occur.

The operating characteristics, which include for example temperaturesensitivity Δf/fΔT and pressure sensitivity Δf/fΔP, depend on theorientation of the substrate in which the surface acoustic wavepropagates and the propagation direction (hereinafter "γ", measuredrelative to the digonal axis in singly rotated orientations) of thesurface acoustic wave. Generally, the response of a SAW device having aparticular orientation can be represented by a two dimensionalpolynomial in temperature and pressure as: ##EQU1##

The orientation of a substrate may be specified in accordance withstandards adopted by the Institute of Radio Engineers, now the Instituteof Electrical and Electronic Engineers or "IEEE", which appear in"Standards on Piezoelectric Crystals, 1949: Standard 49 IRE 14.S1,"Proceedings of the I.R.E., December 1949, pp. 1378-90 and which areincorporated herein by reference thereto. Both singly rotated and doublyrotated cuts are referred to herein by the nomenclature (yxwl) Φ/θ.Quartz belongs to the trigonal crystal system, international point group32, class D₃ (Schoenflies symbol) and exhibits digonal (2π/2-fold)symmetry and trigonal (3π/2-fold) symmetry about the X and Z axes,respectively, which means that orientations having Φ=n(120°)±Φ_(o) (forn=0,1,2) and θ=θ_(o) +m(180°) (where m=0,1) are exactly equivalentbecause of the crystal symmetry.

To obtain singly rotated orientations at the flats, the cylinder 1should be bored from a quartz piece such that the longitudinal axis ofcylinder 1 and the X axis of the quartz piece are parallel to oneanother. If this is the case, flat 2a is milled to a depth r₁ in a planeperpendicular to a line displaced from the Y axis by the selectedrotation angle, and flat 2b is milled to a depth r₁ in a planeperpendicular to a line displaced from the Y axis by the selectedrotation angle plus 180 degrees. Since flats 2a and 2b are 180° apart,their orientation will be identical (within the mechanical accuracy ofthe boring and milling processes) due to the digonal symmetry of quartz.

Once the flats 2a and 2b are milled, the machined surfaces are preparedfor fabrication of the SAW devices. Due consideration should be given tothe surface preparation and optical polishing in order to minimize thedevelopment of intrinsic surface stress and the initiation ofmicro-cracks at the milled surface when the probe structure is subjectedto an applied load. Such intrinsic surface stress is caused byirregularities on the machine milled surfaces and influences thefrequency characteristics of a SAW oscillator as it relaxes over time.This influence can seriously impair the accuracy and stability of thepressure sensor. Suitable surface preparation and polishing techniquesare well known in the art.

Techniques for suitably fabricating SAW delay lines or resonators onflats are known, and therefore will be described herein only briefly.SAW delay lines and resonators are particularly advantageous for use inthe pressure sensor of the present invention. A surface acoustic wavecan be made to propagate on a smooth surface of a crystalline solid. Theenergy content of such a surface acoustic wave decays exponentially withdepth of the host material and most of the wave energy is concentratedwithin one wave length from the surface. The surface acoustic wave,therefore, will propagate substantially independently of conditions towhich the opposite surface of the host solid may be exposed.Furthermore, SAW delay lines and resonators, which exhibit a much higherQ, on the order of 100 times, than the equivalent electrical circuit,are advantageously employed as feedback elements in crystal controlledoscillators. Furthermore, the narrow bandwidth characteristic of SAWdelay lines and resonators permits a more precise frequency of resonanceto be achieved.

A SAW delay line comprises an array of input electrodes and an array ofoutput electrodes deposited on the surface of a piezoelectric substrate.The electrode arrays have the form of a line array which transmits sonicenergy in the end fire direction along the surface of the substrate. Inthe pressure sensing diaphragm embodiment of FIGS. 1-3, for example, onesurface delay line comprises interdigital transducers 6a (transmitter)and 8a (receiver) fabricated on flat 2a by means of, for example,standard photolithographic and thin-film techniques. In cases in whichinduced self noise unacceptably limits short-term or long-term stabilityof the SAW device, stability can be improved by recessing the electrodestructure, interdigital transducers 6a and 8a in this case, as disclosedin a U.S. patent to Parker et al (U.S. Pat. No. 4,270,105, issued May26, 1981) and which is incorporated herein by reference thereto.Similarly, a second surface wave delay line comprises interdigitaltransducers 6b (transmitter) and 8b (receiver) fabricated on flat 2b.The fingers of each transducer are spaced apart by a half wavelength,the wavelength being selected in consideration of the velocity ofpropagation on the selected orientation of the piezoelectric material sothat the wave generated is of a predetermined frequency. The amplitudeand bandwidth of the wave which may thereby be generated are determinedby the number of finger pairs employed in the array, the bandwidth beinginversely proportional to the number of fingers. The propagationdirection γ in the substrate is normal to the fingers of theinterdigital transducer. The power angle, which is defined as the anglebetween the energy flow direction and the wave vector, is zero for puremode directions such as in the ST-X and SST cuts of quartz.

SAW resonators may advantageously be substituted for SAW delay linesunder certain circumstances. SAW resonators employ ion-milled grooves orreflecting strips to form a resonant cavity having an electrode array inthe center. The design, fabrication and practical considerationsassociated with SAW delay lines and resonators are described more fullyin these articles: M. F. Lewis, "Surface Acoustic Wave Devices andApplications, Section 6: Oscillators--The Next Successful SurfaceAcoustic Wave Device," in Ultrasonics, May 1974, pp. 115-23; and D. T.Bell, Jr. and R. C. M. Li, "Surface-Acoustic Wave Resonators," inProceedings of the IEEE, Vol. 64, No. 5, May 1976, pp. 711-21, and whichare incorporated herein by reference thereto.

The pressure sensing diaphragm embodiment of FIGS. 1-3 is mounted withina suitable pressure housing and coupled to suitable electroniccircuitry. The pressure housing is described below in the context ofanother internally loaded embodiment. Exemplary electronic circuitry isshown schematically in FIG. 6. Two measuring channels are shown, onecomprising oscillator 203a and counter 208a, and the other comprisingoscillator 203b and counter 208b. Oscillators 203a and 203b are coupledto a diaphragm 200, which corresponds for example to the diaphragmembodiment of FIGS. 1-3. Oscillator 203a comprises SAW device 202a(which corresponds for example to the SAW delay line comprising flat 2a,transmitter 6a, and receiver 8a), wide band amplifier 204a, and matchingnetworks 206a and 213a coupled in a feedback arrangement. Oscillator203b comprises SAW device 202b (which corresponds for example to the SAWdelay line comprising flat 2b, transmitter 6b, and receiver 8b), wideband amplifier 204b, and matching networks 206b and 213b coupled in afeedback arrangement.

The design of SAW oscillators is known and therefore will be describedherein only briefly. One component of a SAW oscillator is the SAW delayline or resonator which resides in the feedback path of a widebandamplifier. Any change in the surface wave velocity produces acorresponding accurately measureable change in the frequency ofoscillation. A properly deisgned SAW oscillator will have the followingcharacteristics: (1) the loop gain exceeds the net loss, (2) thefrequency of oscillation must be in the passband of the interdigitaltransducers, and (3) the total phase shift around the loop must be anintegral multiple of 2π. The third requirement can be expressed as##EQU2## where f is the SAW oscillator center frequency; V is thesurface wave velocity relative to the reference frame; l is theeffective path length in the reference frame; φ_(a) is the phase shiftin the amplifier, matching networks and interdigital transducers; and nis an integer. The phase shift φ_(a) generally is negligible compared tothe phase shift over a path length "l" of hundreds of wavelengths in atypical SAW delay line. The fractional change in the "natural" velocityis equivalent to the fractional change in the oscillator frequency,i.e., ##EQU3## as discussed in Sinha & Tiersten, "On the temperaturedependence of the velocity of surface waves in quartz," J. Appl. Phys.51(9), September 1980, pp. 4659-65 and which is incorporated herein byreference thereto.

The frequency stability of the SAW oscillator, which is an importantcharacteristic for precision pressure measurement, customarily isexpressed in three regions: short term, referring to stability over aperiod of seconds, and particularly from 1 to 10 seconds; medium term,referring to stability over a period of hours; and long term, referringto stability over a period of months or years. The short term and mediumterm stability (FM noise) partly defines the resolution and accuracy ofthe oscillator, and various measures may be taken to minimize thisnoise. These measures include selecting an amplifier with low noise andlow gain and SAW devices having low insertion loss and a steepphase-frequency slope (group delay). Either a SAW delay line or SAWresonator may be selected for the oscillator, depending on theapplication at hand. Delay line structures are inherently wideband andare preferred where tunability and linearity are important, whereasresonator structures are superior in the noise performance for narrowband applications. Frequency stability of at least 10⁻¹¹ for a 1 secondgate time has been achieved in SAW oscillators, which is sufficient forobtaining the resolution and dynamic range desired for precisionpressure measurements.

Various techniques for tuning SAW devices are known, as shown in, e.g.,U.S. Pat. No. 4,243,960, issued Jan. 6, 1981 to White et al., and whichare incorporated herein by reference thereto. Various techniques foroperating SAW devices at the fundamental frequency or at harmonicfrequencies, as appropriate, are known, as shown by, e.g., U.S. Pat. No.4,249,146, issued Feb. 3, 1981 to Yen et al., and which are incorporatedherein by reference thereto.

The outputs f_(a) of oscillator 203a and f_(b) of oscillator 203b arefurnished to respective counters 208a and 208b which respectively countthe frequency of their input signals and provide a digitalrepresentation thereof at the output, thereby converting the analogoutput of the oscillators 203a and 203b to digital signals. The samplingsequence is initiated by processor 207, which signals counters 208a and208b along lines 201 and 205 to sample the output of oscillators 203aand 203b respectively and to transmit the results along input lines 211and 212. The digital signals representing f_(a) and f_(b) are furnishedto processor 207, which determines the pressure measurement, suppliesthe result to recorder 209 for presentation to the user, and resetscounters 208a and 208b along lines 201 and 205 respectively for the nextmeasurement cycle.

Processor 207 implements either a curve fitting routine or a look-uptable and interpolation technique to determine the respective pressuremeasurements from one of the signals f_(a) and f_(b), or from theaverage of the signals f_(a) and f_(b). The pressure measured by a SAWdevice as a function of frequency and temperature can be expressed by atwo-dimensional polynomial of the form: ##EQU4## which with constanttemperature reduces to the form: ##EQU5## where from equation (4) thecoefficients A, B, C and D correspond to H₁ +H₇ T+H₉ T² +. . . , H₂ +H₈T+. . . , H₃ +. . . , and H₀ +H₄ T+H₅ T² +H₆ T³ +. . . respectively. Inimplementing the curve fitting technique, during the calibration phasethe selected signal is measured over a range of selected pressures at agiven operating temperature and the values thereby obtained are used toderive the coefficients of equation (5). During the measurement phase,the pressure measurement is calculated from the frequency of theselected signal by applying equation (5) with the coefficientsdetermined in the calibration phase. In implementing the look-up tabletechnique, during the calibration phase the selected signal is measuredover a range of selected pressures at a given operating temperature andthe values thereby obtained are stored into a table of pressure versusfrequency. During the measurement phase, the pressure measurement isdetermined from consulting the look-up table and using interpolation ifnecessary. Curve fitting techniques and look-up table and interpolationtechniques are well known in the art. A suitable curve fitting techniqueis described in J. M. Mendel, Discrete Techniques of ParameterEstimation, Marcel Dekker, Inc., New York, 1973, Ch. 2, and isincorporated herein by reference thereto. A suitable interpolationtechnique is described in K. S. Kunz, Numerical Analysis, McGraw-HillBook Company, Inc., New York, 1957, Ch. 5, and is incorporated herein byreference thereto.

The values of f_(a) and f_(b) may be monitored and compared with oneanother by processor 207 to detect a deviation above a given tolerancewhich would indicate uneven thermal distribution in the diaphragm or afailure of at least one of the oscillators.

An externally loaded diaphragm is shown in FIGS. 4-5. A cylindricalmember 10 of length L_(o), preferably of quartz, is sliced into twosections 11 and 13 along cut 15 so as to preserve continuity of thelattice across the cut. Cut 15 preferably although not necessarilyshould be made to optimize the mechanical symmetry of the diaphragm.Respective portions of a cylindrical space 14 are created by millingsections 11 and 13, and two longitudinal flats 12a and 12b are milledinto the inside surface of cylinder 10, away from the cut 15, to createopposite parallel surfaces, as described above with respect to theinternally loaded embodiment. Flats 12a and 12b are milled to depths r₁,thereby creating respective portions of the diaphragm having thicknesst₁. The axis of the internal space 14 coincides with the axis ofcylinder 10. The various structural features of the diaphragm of FIGS.4-5 and of the other externally loaded embodiments described herein,unless otherwise specified, may be dimensioned as follows, although thedimensions, which are a function of the type of material used, the typeof SAW devices employed in the structure, the propagation direction ofthe surface acoustic wave energy which determines the location of theSAW devices, and the specifications of the pressure sensor, may beoptimized for specific applications. The cylinder 10 may have a diameter"D" of 26 mm and a length "L_(o) " of 50 mm. The space 14 may have adiameter of 10 mm and a length "L_(I) " of 35 mm. Each flat 12a and 12bmay have a width of 5 mm and a length of 12 mm. The milling depth r₁ maybe 3 mm. The location of the bore 14 and the milling depth r₁ to whicheach flat is milled establishes the thickness t₁, which may be 5 mm.

SAW devices are fabricated on the diaphragm on flats 12a and 12b, ordirectly on the internal curved surface, or in accordance with othersuitable arrangements as described above. The diaphragm is mounted in asuitable pressure housing, as described below, and coupled to theelectronic circuitry shown in FIG. 6, in which case SAW device 202acorresponds to flat 12a, transmitter 16a, and receiver 18a, and SAWdevice 202b corresponds to flat 12b, transmitter 16b, and receiver 18b.The operation of processor 207 is similar.

The overall shape of the diaphragm is selected to withstand a selectedhigh pressure with a minimum physical mass. Although a cylindricalstructure is superior to other shapes in these respects, the diaphragmof the present invention is not limited to a cylindrical shape. Othersuitable shapes for the outside and/or inside surfaces include ellipticand parabolic, for example.

Although the foregoing description pertains to cylindrical diaphragms,the present invention also includes internally and externally loadedspherical diaphragms as well. An illustrative spherical diaphragm isshown in FIGS. 32 and 33. This illustrative embodiment is externallyloaded. A spherical member 500 of diameter "D₀," preferably of quartz,is sliced into two sections 501 and 503 along cut 505 so as to preservecontinuity of the lattice across the cut. Internal spherical space 504of diameter "D_(I) " and respective flats 502a and 502b are milled intothe sections 501 and 503, thereby creating respective portions of thediaphragm having thickness t₁. Respective SAW devices 508a and 508b arefabricated on the flats 502a and 502b.

The teachings in this Specification pertaining to the cylindricaldiaphragm are generally relevant to the spherical diaphragm, althoughthe dominant stresses occurring in the spherical diaphragm are theorthogonal hoop stresses, which are of similar magnitude. Thus, forexample, diameter D₀ may be 26 mm and D_(I) may be 10 mm. Flats 502a and502b may be milled to a depth r₁ of 2 mm, thereby establishing thethickness t₁ at 5 mm. Alternatively, as discussed below for thecylindrical diaphragm, the flats may be milled to different thicknessesor different wall thicknesses may be created by eccentering the centerof the inner spherical surface and the center of the outer sphericalsurface.

Self Temperature Compensation

FIGS. 7-23 are directed to self temperature compensated embodiments ofpressure sensing diaphragms. The pressure response of such a pressuresensing diaphragm is a function of the difference between the respectivefrequencies of two or more oscillators having identicalfrequency-temperature characteristics but respective frequency-pressurecharacteristics that are functions of the different effectivethicknesses to which substrates of the diaphragm are made. Although allsubstrates are subjected to the same hydrostatic pressure, the pressureof the fluid elastically deforms the respective substrates to differentdegrees. Temperature affects the substrates equally, provided thediaphragm is compliantly supported. Accordingly, the outputs of therespective oscillators are mixed to eliminate the temperature effects.The elastic rigidity of the self temperature compensated diaphragm isstrongly dependent on thickness, so that the difference in thicknessesof the substrates need differ by only a small amount. In addition toproviding temperature compensation, this technique advantageouslycancels the effect of long-term aging on the pressure measurement,provided the long-term aging characteristics of the respectiveoscillators comprising are well matched.

Embodiments of the pressure sensing diaphragm having the characteristicsdescribed above and comprising two measurement channels are shown inFIGS. 7-9 and 12-13. In the internally loaded embodiment of FIGS. 7-9, acylindrical member 20, preferably of quartz material, is provided withfour longitudinal flats 22a, 22b, 22c and 22d milled into the outsidevolume of cylinder 20 preferably but not necessarily at ninety degreeintervals (as explained below), measured normal to the flats, such thatflats 22a and 22c lie in respective planes that are parallel to oneanother and normal to respective parallel planes passing through flats22b and 22d. Each flat 22a, 22b, 22c and 22d is milled to the depth r₁.A bore 24, which has an axis indicated by the imaginary line bb, is madein cylinder 20, which has an axis indicated by the imaginary line aa.Axis bb is parallel to axis aa of cylinder 20 but offset therefrom at asuitable angle β (FIG. 9) and displaced therefrom by a distance d (FIG.7) so as to create respective thickness portions t₁, t₂, t₃ and t₄between each of the flats 22a-22d and the wall of the bore 24.

The various structural features of the internally loaded embodiment ofFIGS. 7-9 may be dimensioned in accordance with the teachings of FIGS.1-3 and accompanying text, except that the bore 24 may be made in thecylinder 20 with an angular displacement "β" of about 56 degrees and adisplacement "d" of the axes aa and bb of about 0.7 mm. The millingdepth r₁ may be 2 mm. The location of the bore 24 and the milling depthr₁ to which each flat is milled establishes the thicknesses t₁, t₂, t₃and t₄, which may approximately be respectively 5.4 mm, 6.4 mm, 6.6 mm,and 5.6 mm.

It has been determined that orientations in the neighborhood of the theST cut ((yxwl) 0°/42.75°, γ=0°) and the SST cut ((yxwl) 0°/-49.22°,γ=23°) are suitable for use in the self temperature compensatedembodiments, although a number of other singly rotated and doublyrotated orientations may be suitable as well. The ST cut is discussed inU.S. Pat. No. 3,818,382, issued June 18, 1974 to Holland et al. and isincorporated herein by reference thereto. The SST cut was reported in B.K. Sinha and H. F. Tiersten, "Zero Temperature Coefficient of Delay ForSurface Waves In Quartz," Applied Physics Letters, Vol. 34, pp. 817-19(1979) and is incorporated herein by reference thereto, and theexperimental verification was reported in T. Lukaszek and A. Ballato,"What SAW Can Learn from BAW: Implications for Future Frequency Control,Selection, and Signal Processing," Proceedings of the 1980 UltrasonicsSymposium (IEEE Cat. 80CH1602-2), pp. 173-83 and is incorporated hereinby reference thereto. For the nominal ST orientation at γ=0°, Δf/fΔT isvery small in the vicinity of 25° C. and |Δf|/fΔP≃7×10⁻⁸ /psi. For thenominal SST orientation at γ=23°, Δf/fΔT is very small in the vicinityof 25° C. and |Δf|/fΔP≃10⁻⁷ /psi. The Q of both orientations issatisfactory, and both orientations exhibit zero first-order temperaturecoefficients of delay for surface acoustic waves.

For reasons explained below in the context of weighting-type temperaturecompensation, the ST orientation (yxwl) 0°/40°, γ=0° having a turnovertemperature of 40° C. and the SST orientation and (yxwl) 0°/-49.2°,γ=21.5° having a turnover temperature of 90° are selected. It will beappreciated that the degrees specified for the orientations discussedherein are only approximate. The actual degrees of the cut for thedesired characteristics can vary by about ±4° depending on such factorsas the electronics, the quality of the quartz material, the selectedturnover temperatures, the material and design of the interdigitaltransducers, and operation in overtone modes.

A first flat 22a is milled in a plane perpendicular to a line displacedfrom the Y-axis by a rotation angle θ_(SST) in the Z-Y plane equal to-49.2°. A second flat 22b is milled in a plane perpendicular to a linedisplaced from the Y axis by a rotation angle θ_(ST-X) in the Z-Y planeequal to 40.0°. Because of the digonal symmetry of quartz, the SSTorientation can be replicated on the side of the cylinder 20 oppositeflat 22a by milling a third flat 22c in a plane perpendicular to a linedisplaced from the Y-axis by a rotation angle of 130.8°, and the ST-Xcut can be replicated on the side of the cylinder 20 opposite flat 22bby milling a fourth flat 22d in a plane perpendicular to a linedisplaced from the Y-axis by a rotation angle of -140.0°. While theorientations thus described are desirable for the preferred operation ofthe self temperature compensation embodiments, they are displaced by anangle θ_(ST-X) -θ_(SST) =89.2°. Although it is preferred that each flatbe displaced from the other in such a way as to optimize mechanicalsymmetry, i.e. in this particular embodiment by 90°, the minor variationof 0.8° from this desired relationship should not seriously degrade thenominal characteristics of the pressure sensing diaphgragm.

Techniques for suitably milling flats of preselected orientations areknown, and therefore will be described herein only briefly. Theavailability of suitable portions of a quartz cylinder such as 20 inwhich to mill flats 22a-22d, for example, to achieve the desiredcrystallographic orientations depends on properly forming the cylinderfrom the raw crystal. To acheve singly rotated orientations for theflats, the X, Y and Z axes of a raw quartz piece 50 shown in FIG. 17 areidentified and a cylinder 51 having its longitudinal axis parallel withthe X axis of the quartz piece 50 is fashioned from the quartz piece 50,preferably by a boring technique. Viewed in the direction of the X-axisand perpendicular to the Y-Z plane (FIG. 18), the cylinder 51 ispositioned for the milling of four flats having the desiredcrystallographic orientations at the selected angles of rotation θrelative to the Y axis in the Y-Z plane. The θ_(ST-X) and θ_(SST)orientations are shown in FIG. 18.

The transducers 26a and 28a on flat 22a and 26c and 28c on flat 22c arefabricated in accordance with the criteria: propagation direction γequal to 21.5°, power flow angle equal to zero degrees. The transducers26b and 28b on flat 22b and 26d and 28d on flat 22d are fabricated inaccordance with the criteria: propagation direction γ equal to zerodegrees, power flow angle equal to zero degrees.

The frequency of operation of the SAW oscillators is selected on thebasis of the size available to or desired for the associated SAW device,oscillator stability, and Q. A suitable range of operating frequency is150 MHz-600 MHz; 200 MHz having been selected for the embodimentsdescribed herein. The SAW devices may be designed for a higher frequencyof operation, e.g. 1 GHz, if a smaller substrate area is desired,although such devices must be designed and fabricated with extremelygreat care to avoid parasitic and other undesirable effects which woulddegrade performance.

The self temperature compensated, internally loaded pressure sensingdiaphragm is shown in FIGS. 10 and 11 mounted in an illustrativepressure housing, which should compliantly support the diaphragm. Thepressure housing comprises cylindrical stainless steel casing members71, 72 and 73 which engage one another along a suitable joint and areheld rigid and pressure tight by screws 302, 304, 306, 308 and others asnecessary (not shown). Seals 301 and 303, which may be of any suitablematerial such as polyminide, for example, ensure a fluid tight contactbetween housing members 71 and 73 and 71 and 72. End casing members 71and 72 are provided with respective ports 78 and 79 by which the fluidis introduced into the volume 69 and to the diaphragm. The assemblycomprising cylinder 20, endcaps 62 and 64, and cylinder 66 is 85 mm inlength and is supported within the pressure housing by a plurality ofresilient members 309-320, forming the volume 69 into which the fluid isintroduced. Resilient members 309-320 may be loosely fitted nylon rings,for example. The volume 69 communicates with bore 24 through volumes 75and 77, the large diameter portions of which should extend about 17 mminto the endcap to reduce shear stresses across the joints between theend caps 62 and 64 and cylinder 20. The end caps 62 and 64 snugly engagethe outside of respective end portions of cylinder 20 by the insideedges of respective continuous circular flanges. The end caps 62 and 64also snugly engage the inside end portions of casing 66 by the outsideedges of the respective flanges. The end caps 62 and 64 are sealed tocylinder 20 and cylinder 66 along their areas of contact using suitabletechniques such as the glass frit technique, which is well known. Thisstructural arrangement results in a compliant support for the diaphragm,provided that the respective crystallographic orientations of thediaphragm, the end caps 62 and 64, and the cylinder 66 are well matchedto yield a continuous crystal lattice. Preferably, the glass fritbonding material should have a thermal expansion coefficientcommensurate with the coefficients of the crystal and should be appliedin as thin a layer as practical.

A generally cylindrical volume 68 bonded by cylinder 66 on the outside,cylinder 20 on the inside, and the inside annular surface of endcaps 62and 64 at the respective ends is formed. The volume 68 is evacuated toform a benign environment for the proper functioning of the four delaylines comprising respective flats 22a, 22b, 22c and 22d and respectivetransducer pairs 26a and 28a, 26b and 28b, 26c and 28c, and 26d and 28d.Each transducer 26a-d and 28a-d is connected to a respective terminal70a-70d securely mounted on the outside of and insulated from the steelcasing member 73 by respective thin insulated wires 74a-74d and 76a-76d,which may be any suitable thin wire such as teflon-coated aluminumalloy, passing through respective narrow channels provided in thecylinder 66, resilient members 311, 319, 316, and 320, and housingmember 73. The channels are suitably sealed to maintain the benignenvironment in volume 68 and the fluid in volume 69. The fluid havingits pressure measured is introduced into pressure ports 78 and 79 whichis made in end caps 62 and 64 in axial alignment with bore 24.

As a fluid is introduced into bore 24, the cylinder 20 flexes inaccordance with the pressure of the introduced fluid and adjusts to thetemperature of the introduced fluid. The pressure sensor is of a smallsize and all elements thereof, notably cylinder 20, end caps 62 and 64,and cylinder 66 come into thermal equilibrium rapidly. Because of thedifferent thickness between flats 22a, 22b, 22c, and 22d and the bore24, however, the respective regions of the cylinder 20 at flats 22a,22b, 22c and 22d are flexed to different degrees.

An externally-loaded embodiment that is self temperature compensated isshown in FIGS. 12-13. A cylindrical member 30 of length L_(O),preferably of quartz, is sliced into two sections 31 and 33 along cut35. Preferably, cut 35 is made parallel to the X-Y plane (in FIG. 18,along the Y axis line). Since the thermal expansion coefficients alongall directions in the plane are identical (13.71×10⁻⁶ /°C.), a glassfrit bonding material having a thermal expansion coefficient equal orsimilar to that of the crystalline material in the X-Y plane may beselected to reduce stresses generated along the cut 35. A cut in the X-Yplane will provide good, although not exact, mechanical symmetry withuse of the ST-X and SST orientations. Respective portions of cylindricalspace 34 are created by milling sections 31 and 33, and fourlongitudinal flats 32a, 32b, 32c and 32d are milled into the insidevolume of cylinder 30, away from the cut 35, to create opposing STorientations and opposing SST orientations, as explained above withrespect to the internally loaded embodiment. The axis of the internalspace 34 coincides with the axis of the cylinder 30. The diaphragmregion of different thicknesses are created by milling opposite flats todifferent depths. Accordingly, flats 32a and 32c are milled to depths r₁and r₂ respectively, thereby creating respective portions of thediaphragm having different thicknesses t₁ and t₂ respectively; and flats32b and 32d are milled to depths r₁ and r₂ respectively, therebycreating respective portions of the diaphragm having differentthicknesses t₁ and t₂ respectively. If preferred, each flat 32a-32d maybe milled to different depths. SAW delay lines comprisingtransmitter-receiver pairs 36a and 38a, 36b and 38b, 36c and 38c, and36d and 38d are fabricated on respective flats 32a-32d. Once the SAWdevices are fabricated, the two portions 31 and 33 of cylinder 30 arebonded together using preferably a glass frit bonding technique. Thevolume 34 is evacuated to form a benign environment for the properfunctioning of the four delay lines comprising respective flats 32a-32dtransducer pairs 36a and 38a, 36b and 38b, 36c and 38c, and 36d and 38d.Leads from the SAW devices are fabricated on the surface surrounding thevolume 34 and taken through the bonding layer to terminals on theoutside of the pressure sensing diaphragm. Details of the completeddiaphragm housed in a suitable pressure housing are described below.

The various structural features of the externally loaded embodiment ofFIGS. 12-13 may be dimensioned in accordance with the teachings of FIGS.4-5 and accompanying text, except that the milling depth r₁ may be 2 mmand the milling depth r₂ may be 4 mm. The location of the space 34 andthe milling depths r₁ and r₂ to which the flats are rolled establish thethicknesses t₁ and t₂, which may be respectively 6 mm and 4 mm.

The self temperature compensating, internally loaded pressure sensingdiaphragm is shown in FIGS. 14-15 mounted in an illustrative pressurehousing. The pressure housing comprises cylindrical stainless steelcasing members 40, 41 and 42 which engage one another along a suitablejoint such as a rabbet joint and are held rigid and pressure tight byscrews 330, 331, 332, 333 and others as necessary (not shown). Seals 56and 57, which may be of any suitable material such as polyminide, forexample, ensure a fluid tight contact between housing members 40 and 41and 40 and 42. End housing members 41 and 42 are provided withrespective ports 58 and 59 by which the fluid is introduced into thevolume 45 and to the diaphragm. Cylinder 30 is supported within thepressure housing by a plurality of resilient members 43a-43c, 47a-47c,and 340-343, forming the volume 45 into which the fluid is introduced.Respective leads from the transducers 36a-36d and 38a-38d are fabricatedon the surface surrounding volume 34 and pass through the bonding layer,resilient member 47a, and a small channel in the housing member 41 to aterminal strip 48 suitably mounted thereon. The channel is suitablysealed. Only lead 44d, which connects transmitter 36d to terminal 48,and lead 46d, which connects receiver 38d to terminal 49 are shown, theother leads being omitted to simplify the figure.

As a fluid is introduced into annular volume 45, the cylinder 30 flexesin accordance with the pressure of the introduced fluid and adjusts tothe temperature of the introduced fluid. The pressure sensor is of arelatively small size and all elements thereof come into thermalequilibrium rapidly. Because of the different thickness of the substrateassociated with flats 32a and 32c, and flats 32b and 32d, however, therespective regions of the cylinder 30 in those regions are deformed todifferent degrees.

Both the internally loaded and externally loaded embodiments of the selfcompensating pressure sensing diaphragm provide two independenttemperature-compensated measurements of pressure. An exemplary circuitwhich may be coupled to the pressure sensor of either FIG. 10 or FIG. 14for achieving the improved results is shown in FIG. 16. Two measuringchannels are shown in FIG. 16, one comprising oscillators 88a and 88c, amixer 90, and counters 91, 92, and 93; and the other comprisingoscillators 88b and 88d, a mixer 94, and counters 95, 96, and 97. SAWdevices 82a, 82b, 82c and 82d comprising, for example, respectivelytransmitters 26a-26d and receivers 28a-28d mounted on flats 22a-22d areincluded on diaphragm 80. The crystallographic orientation of devices82a and 82c are the same (in the neighborhood of the SST orientation)and the respective substrate thicknesses are different, so that devices82a and 82c have identical frequency-temperature characteristics anddifferent frequency-pressure characteristics when subject to identicaltemperature and hydrostatic pressure. The output (f_(a)) of oscillator88a comprising SAW device 82a, amplifier 84a, and matching networks 85aand 86a, and the output (f_(c)) of oscillator 88c comprising SAW device82c, amplifier 84c, and matching networks 85c and 86c, are furnished tomixer 90. The output of mixer 90, the difference f_(a) -f_(c), isfurnished to counter 92 which counts the frequency of the input signaland provides a digital representation thereof at its output, therebyconverting the analog output of mixer 90 to a digital signal. Counters91 and 93 count the frequency of f_(c) and f_(a) respectively andprovides digital representations thereof. Similarly, thecrystallographic orientation of devices 82b and 82d are the same (in theneighborhood of the ST-X orientation) and the respective thicknesses aredifferent, so that devices 82b and 82d have identicalfrequency-temperature characteristics and different frequency-pressurecharacteristics when subject to identical temperature and hydrostaticpressure. The output (f_(b)) of oscillator 88b comprising SAW device82b, amplifier 84b, and matching networks 85b and 86b, and the output(f_(d)) of oscillator 88d comprising SAW device 82d, amplifier 84d, andmatching networks 85d and 86d are furnished to mixer 94. The output ofmixer 94, the difference f_(b) -f_(d), is furnished to counter 96 whichcounts the frequency of the input signal and provides a digitalrepresentation thereof at its output, thereby converting the analogoutput of mixer 94 to a digital signal. Counters 95 and 97 count thefrequency of f_(d) and f_(b) respectively and provides digitalrepresentations thereof.

Although not shown in FIG. 10 or FIG. 14, oscillators 88a-88d may befabricated as integrated circuits and mounted on surfaces within theevacuated space 68 and 34 respectively, near enough to associated SAWdevices to allow short lead length for reducing parasitic effects andimproving oscillator stability, without affecting the elasticdeformation of the diaphragm.

The digital signals representing f_(a), f_(c), and f_(a) -f_(c), andf_(b), f_(d), and f_(b) -f_(d) are supplied to processor 98, whichdetermines the pressure measurement and supplies the result to recorder99. Signals f_(a), f_(b), f_(c) and f_(d) are used in the weighting-typetemperature compensation described below and are not necessary for selftemperature compensation; the counters 91, 93, 95 and 97 which providethem may be omitted from the circuit of FIG. 16 if only self temperaturecompensation is desired. The processor 98 also resets counters 91-93 and95-97 for their next measurement cycle.

Processor 98 implements either a curve fitting routine or a look-uptable and interpolation technique to determine the respective pressuremeasurements from f₁ -f_(c) and f_(b) -f_(d). The techniques areimplemented essentially as described in the portion of thisSpecification associated with FIG. 6, except that either f_(a) -f_(c) orf_(b) -f_(d) is substituted for the parameter "f" in equation (5).

Other self temperature compensation embodiments also are contemplated bythe present invention. For example, an externally loaded embodimentbased on the features of eccentered bore and plural measurements isshown in FIGS. 19-20. A cylindrical member 130 of length L_(O),preferably of quartz material, is sliced into two sections 131 and 133along cut 135. Cut 135 should be made in the X-Y plane preferably toprovide as such mechanical symmetry as possible, without interferingwith four longitudinal flats 132a, 132b, 132c and 132d which are milledinto the inside volume of cylinder 130 to create opposing STorientations and opposing SST orientations, as explained above. Eachflat 132a, 132b, 132c and 132d is milled to the depth r₁. A space 134 oflength L_(I), which has an axis indicated by the imaginary line bb, ismade inside cylinder 130 equidistant from the ends of cylinder 130,which has an axis indicated by the imaginary line aa. Axis bb isparallel to axis aa of cylinder 130 but offset therefrom at a suitableangle β and displaced therefrom by a distance d so as to createrespective thickness portions t₁, t₂, t₃ and t₄ between each of theflats 132a-132d and the outside surface of the cylinder 130.

The various structural features of the externally loaded embodiment ofFIGS. 19-20 may be dimensioned in accordance with the teaching of FIGS.4-5 and accompanying text, except that the space 134 may be made in thecylinder 130 with an angular displacement "β" of about 51 degrees and adisplacement "d" of the axes aa and bb of about 1.4 mm. Each flat132a-132d may have a width of 5 mm and a length of 12 mm. The millingdepth r₁ may be 2 mm. The location of the bore 134 and the milling depthr₁ to which each flat is milled establishes the thicknesses t₁, t₂, t₃and t₄, which may approximately be respectively 4.9 mm, 6.9 mm, 7.1 mm,and 5.1 mm.

The orientations of the milled flats are selected on the same basis as,and the fabrication of suitable SAW devices is performed in the same wayas described above. Once the SAW devices are fabricated, the twoportions 131 and 133 of cylinder 130 are bonded together and placedwithin a housing as described with respect to FIGS. 14 and 15, and thediaphragm coupled to the measurement circuit of FIG. 16.

In another embodiment of an internally loaded sensor, the axes of thebore and cylinder are coincident but the flats milled to differentdepths to achieve the different substrate thickness in accordance withthe present invention. For example, FIG. 21 shows opposite flats 150aand 150c having a given orientation, e.g. the SST orientation, milled todifferent thicknesses r₁ and r₂ respectively, thereby creatingrespective portions of the diaphragm having different thicknesses t₁ andt₂ respectively. Similarly, opposite flats 150b and 150d are milled tothicknesses r₁ and r₂ respectively, thereby creating respective portionsof the diaphragm having different thicknesses t₁ and t₂ respectively.Although the milling depth for flats 150a and 150b is the same, r₁, andthe milling depth for flats 150c and 150d is the same, r₂, each of theflats may be milled to a different depth if desired.

A simplified embodiment of the self temperature compensated pressuresensing diaphragm, lacking plural measurements, is shown for aninternally loaded device in FIG. 22. An externally loaded device may beconstructed based on the same teaching. The embodiment of FIG. 22requires only a single measurement channel comprising flats 160a and160b, milled to respective depths r₁ and r₂ and associated electroniccircuitry such as included in one of the channels of FIG. 16.

The orientations discussed thus far are singly rotated orientationsabout the digonal axis. Other suitable orientations, such as singlyrotated about the trigonal axis or doubly rotated, may be advantageousin certain applications. A diaphragm based on a singly rotatedorientation about the trigonal axis is shown in FIG. 23. FIG. 23 shows asingle measurement channel comprising flats 170a, 170b and 170c milledto depths r₁, r₂ and r₃ respectively. The third flat in the measurementchannel provides a redundant reading to improve the confidence level ofthe measured pressure.

Weighting-Type Temperature Compensation

It has been discovered that the orientations in the neighborhood of theST and SST orientations have another characteristic which, in accordancewith the present invention, may advantageously be used to providetemperature compensated pressure measurements or further to improve theresponse time and accuracy of temperature compensated pressuremeasurements. Specifically, these orientations exhibit different"turnover" temperatures. The frequency-temperature characteristics ofSAW devices exhibit a parabolic behavior, having minimal temperaturedependence of frequency bout the turnover (reference) temperature.Accordingly, the temperature induced error in pressure determinations ismost pronounced at temperatures farthest from the turnover point. Toprovide high precision where the measured fluid is subject totemperature variations in the range of 0° C. to 130° C., for example,two independent pressure measurements taken with SAW devices havingrespective turnover temperatures of 40° C. and 90° C. are combined toyield a more consistently accurate measurements, as described in furtherdetail below. Two suitable orientations are (yxwl) 0°/40.0°, γ=0°yielding a turnover temperature of 40° C. and (yxwl) °/-49.2°, γ =21.5°yielding a turnover temperature of 90° C. The values of Δf/fΔT andΔf/fΔP for the respective orientations at these turnover temperaturesare about the same as stated above.

The turnover temperature of a SAW device can be changed over a widetemperature range by small changes in rotation angle, in the propagationdirection, or in both. For example, for orientations in the neighborhoodof the ST-cut, the turnover temperature increases with a decreasingrotation angle, the propagation direction being held constant along thedigonal axis; and for orientations in the neighborhood of the SST-cut,the turnover temperature increases with either a decreasing rotationangle or a decreasing propagation direction, the other being heldconstant.

The weighting-type temperature compensation may supplement the selftemperature compensation in applications requiring very accuratedetermination of pressure. In such applications, temperature effects maynot be acceptably eliminated by mixing f_(a) and f_(c) or f_(b) andf_(d). Rather, the self temperature compensation technique can underthese circumstances be viewed as providing for accurate and stableoperation over a very broad but not unlimited range of temperatures.FIG. 24 shows graphically the resultant broader range over whichundesirable temperature induced effects are substantially reduced as aresult of the self temperature compensation technique. It will beunderstood that FIG. 24 is illustrative only; the 10° C. shifts shownfor the turnover temperatures of the two SAW devices of like orientationin the respective channels being larger than would be experienced inpractice to clearly illustrate the discussion in this Specification.Curves 402a and 402b represent respectively the frequency-temperaturebehavior of two SAW devices having the ST orientation of (yxwl)0°/40.0°, γ=0°, while curve 404 represents the frequency-temperaturebehavior of the self temperature compensated channel based on SAWdevices having the ST orientation. Away from the selected turnovertemperature of 40° C., curves 402a and 402b are changing rapidly,indicating that the response of the SAW devices will be stronglyaffected by temperature in all but the respective portions of curves402a and 402b in close proximity to the turnover temperature. Curve 404changes very slowly about the turnover temperature in the range ofinterest, 0° C.-130° C., indicating that the response of the selftemperature compensated channel is but weakly affected by temperature inthis range. Curves 406a and 406b represent respectively thefrequency-temperature behavior of two SAW devices having the SSTorientation of (yxwl) 0°/-49.2°, γ=21.5°, while curve 408 represents thefrequency-temperature behavior of the self temperature compensatedchannel based on SAW devices having the SST orientation. Around theselected turnover temperature of 90° C., curves 406a and 406b arechanging rapidly, indicating that the response of the SAW devices willbe strongly affected by temperature in all but the respective portionsof curves 406a and 406b in close proximity to the turnover temperature.Curve 408 changes very slowly about the turnover temperature in therange of interest, 0° C.-130° C., indicating that the response of theself temperature compensated channel is but weakly affected bytemperature in this range. Although the effects of temperature on the"ST" and "SST" channels are small in general, temperature has no effecton the "ST" channel at about 40° C., as shown by curve 404, and noeffect on the "SST" channel at about 90° C., as shown by curve 408.Weighting-type temperature compensation makes advantageous use of thisfeature.

In weighting-type temperature compensation, the respective channelresponses are weighted in accordance with their respectivefrequency-temperature behavior. A simple weighting function isgraphically illustrated in FIG. 25, in which curve 412 represents theweighting function applied to the pressure measurement determined in the"ST" channel and to the temperature measurement determined in the "SST"channel, and curve 414 represents the weighting function applied to thepressure measurement determined in the "SST" channel and to thetemperature measurement determined in the "ST" channel. The optimizedpressure measurement and the optimized temperature measurement aresupplied as output to recorder 99 (FIG. 16).

The weighting function shown in FIG. 25 is premised on thefrequency-temperature characteristics of ST and SST orientations over anextended temperature range. The temperature response of a SAW device asa function of frequency and pressure is a typical two-dimensionalpolynomial of the form: ##EQU6## while the pressure response of a SAWdevice as a function of frequency and temperature is given in equation(4), which is reproduced below: ##EQU7##

The weighting-type temperature compensation technique is used inconjunction with a curve fitting technique. Each of the four oscillators88a-88d is calibrated to provide a pressure measurement as a function offrequency and temperature and a temperature measurement as a function offrequency and pressure in accordance with the two-dimensionalpolynomials for pressure and temperature measurements given in equations(4) and (6). During calibration, f_(a), f_(b), f_(c), f_(d), f_(a)-f_(c) and f_(b) -f_(d) from counters 93, 97, 91, 95, 92 and 96 aremeasured over a broad range of selected pressure and temperatures, andthe coefficients of the polynomials are determined using a parameterestimation technique, such as for example least squares parameterestimation which is described in the Mendel reference cited above andwhich is incorporated herein by reference thereto.

In the measurement phase, an approximate measure of pressure is obtainedfrom the outputs of mixers 90 and 94, signals f_(a) -f_(c) and f_(b)-f_(d) respectively. The approximate pressure measurements, approximatebecause they are weakly affected by temperature, are averaged and theresult used to approximate the temperatures at the four SAW devices byapplication of equation (6) to f_(a), f_(b), f_(c) and f_(d)respectively. A mean temperature is determined, and considered a bestestimate temperature for the following iterative procedure.

The respective temperature determinations from the SAW devices areweighted as a function of the best estimate temperature in accordancewith the illustrative weighting functions given by expressions 10 and 11and shown in FIG. 25 to obtain an improved best estimate temperature.The best estimate temperature, as improved, is used in equation (4) toobtain improved pressure determinations from the signals f_(a) -f_(c)and f_(b) -f_(d). The resulting improved pressure determinations fromthe two channels are weighted as a function of the best estimatetemperature in accordance with the illustrative weighting function givenby expressions (7) and (8) and shown in FIG. 25 to obtain an improvedbest estimate pressure. If the results for the best estimate temperatureand best estimate pressure have appropriately converged, the bestestimates are taken as the correct temperature and pressuremeasurements. Otherwise, the best estimate pressure, as improved, isused in equation (6) to obtain respective temperature determinationsfrom f_(a), f_(b), f_(c) and f_(d), which are processed as describedabove.

Curves 412 and 414 for determining a best estimate of pressure are givenby the expressions: ##EQU8## where the quantities w₁ and w₂ have theform |T-90°|³ and |T-40°|³, respectively, and where 0° C.≦T≦130° C. Thebest estimate of pressure is given by: ##EQU9##

Curves 412 and 414 for determining a best estimate of temperature aregiven by the expressions: ##EQU10## where the quantities y₁ and y₂ havethe form |T-40°|³ and |T-90°|³, respectively, and where 0° C.≦T≦130° C.The best estimate of temperature is given by: ##EQU11##

Although the weighting technique is described as an optimizing techniquein the context of the self temperature compensating embodiment, it maybe applied to other embodiments as well (e.g., the embodiment of FIGS.19-20 and 21), including uncompensated embodiments (e.g., theembodiments of FIGS. 1-3 and 4-5). As applied to the embodiment of FIGS.1-3 and 4-5, for example, the nominally narrow range of temperatureabout the calibration temperature over which the embodiments of FIGS.1-3 and 4-5 would accurately perform can be increased. In implementingthe technique for the embodiment of FIGS. 1-3, for example, flats 2a and2b would have a "ST" orientation while two additional flats of the samethickness as flats 2a and 2b but having a "SST" orientation would beprovided as described above. The weighting function would be suitablymodified to reflect the temperature-frequency behavior of curves 402a,402b and 406a, 406b of FIG. 24 rather than curves 404 and 408.

Measurement Correction

FIGS. 26-31 are directed to embodiments of a pressure sensing diaphragmyielding independent measurements of pressure and temperature. Ameasurement correction pressure sensing diaphragm in accordance with thepresent invention includes at least two SAW devices, one of which isresponsive principally to pressure and the other of which is responsiveprincipally to temperature. The SAW devices are coupled to respectiveamplifiers and matching networks to form respective oscillators. Theoutput of the oscillators are supplied to a suitable processor whichcompensates the pressure measurement in accordance with the temperaturemeasurement. The output of the processor is supplied to a suitableindicator or recording device.

In the internally loaded embodiment of FIGS. 26 and 27, four flats232a--232d are milled on cylinder 230. The flats 232a and 232c have anSST orientation and the flats 232b and 232d have an ST orientation, andare located on the cylinder 230 as discussed above. A bore 238 isprovided in cylinder 230, the axis of bore 238 being coincident with theaxis of cylinder 230. Each flat preferably but not necessarily is milledto a uniform depth r₁, creating a thickness t₁ between the bore wall andeach of the flats 232a--232d. Four interdigital transducers aredeposited on each flat. For example, a preferred arrangement of flat232a is detailed in FIG. 28. Interdigital transmitter 234a and receiver235a form a delay line in which acoustic surface wave energy propagatesalong the line dd. Interdigital transmitter 236a and receiver 237a forma second delay line in which acoustic surface wave energy propagatesalong the line cc. The various structural features of the diaphragm ofFIGS. 26-27 may be dimensioned in accordance with the teachings of FIGS.1-3 and accompanying text.

In the externally loaded embodiment of FIGS. 29 and 30, a cylinder 240of length L_(o), preferably of quartz, is sliced into two sections 241and 243 along cut 248. The location of cut 248 preferably but notnecessarily should be selected parallel to the X-Y plane and a suitablebonding material should be selected, as described above. Portions of aninterior generally cylindrical surface 249 are made in sections 241 and243 so that when assembled, sections 241 and 243 form at their insidesurface a closed coaxial cylindrical space. Four flats 242a-242d aremilled into the inside cylindrical surface 249. Opposite flats 242a and242c have an SST orientation and opposite flats 242b and 242d have an STorientation, and are located on the cylinder 240 as discussed above.Each flat is milled to a uniform depth r₁, creating a thickness t₁between the outer cylindrical surface of cylinder 240 and each of theflats 242a-242d. Four interdigital transducers are deposited on eachflat preferably in the configuration detailed in FIG. 28. For example,interdigital transmitter 244a and receiver 245a form a delay line inwhich acoustic surface wave energy propagates along the line dd.Interdigital transmitter 246a and receiver 247a form a second delay linein which acoustic surface wave energy propagates along the line cc. Thevarious structural features of the diaphragm of FIGS. 29-30 may bedimensioned in accordance with the teachings of FIGS. 4-5.

An important consideration in the design of the SAW delay lines shown inFIG. 28 is the reduction of cross talk between the neighboringinterdigital transducers, which may be reduced to acceptable levels by,for example, metalizing the surface opposite the surface in which theSAW delay line is fabricated to electrically shield the interdigitaltransducers from one another, or by providing sufficient spatialseparation to electrically isolate the interdigital transducers from oneanother. While crossing propagation paths optimally provides for therespective pressure and temperature orientations to be at the sametemperature, the present invention also contemplates the use ofrespective propagation paths that do not cross. Such an arrangementwould provide good electrical isolation of the interdigital transducerslocated on the same flat.

The pressure sensing diaphragms of FIGS. 26-27 and 29-30 are mountedwithin a suitable pressure housing, as described fully above, andcoupled to suitable electronic circuitry such as that shownschematically in FIG. 31. A diaphragm 270, which represents for examplethe diaphragm of FIGS. 26-27 or FIGS. 28-30, is provided with four flats272a-272d, which represent for example the flats 232a-232d or the flats242a-242d. Each flat is provided with a pressure orientation and atemperature orientation. It has been recognized that the SST and STrotations are capable of performing as temperature orientations andpressure orientations if the proper propagation directions are selected.For the selected SST orientation of (yxwl) 0°/-49.2°, γ=0° provides atemperature sensitive orientation typically characterized byΔf/fΔT=19×10⁻⁶ /°C. while γ=21.5° provides a pressure sensitiveorientation typically characterized by |Δf|/fΔP=10⁻⁷ /psi andΔf/fΔT=small about 90° C. For the selected ST orientation of (yxwl)0°/40°, γ=35° provides a temperature sensitive orientation typicallycharacterized by Δf/fΔT=20×10⁻⁶ /°C. while γ=0° provides a pressuresensitive orientation typically characterized by |Δf|/fΔP=7×10⁻⁸ /psiand Δf/fΔT=small about 40° C. Suitable temperature and pressureorientations for the embodiments of FIGS. 26-27 and 29-30 are given inthe following table:

                  TABLE 1                                                         ______________________________________                                        Diaphragm Embodiment  Propagation Direction γ                           FIGS.   FIGS.     Rota-   T     P                                             26-27   29-30     tion    Sense Sense (Turnover)                              ______________________________________                                        232a    242a      SST      0°                                                                          21.5°                                                                        (90° C.)                         232b    242b      ST      35°                                                                          0°                                                                           (40° C.)                         232c    242c      SST      0°                                                                          21.5°                                                                        (90° C.)                         232d    242d      ST      35°                                                                          0°                                                                           (40° C.)                         ______________________________________                                    

The circuit of FIG. 31 comprises four independent measurement channels274a-274d, of which channel 274a is representative. A temperaturesensitive oscillator comprising matching networks 280 and 281 andamplifier 282 provides an output which is digitized in counter 283 andprovided as a signal f_(at) to processor 298. A pressure sensitiveoscillator comprising matching networks 284 and 285 and amplifier 286provides an output which is digitized in counter 287 and provided as asignal f_(ap) to processor 298. Similarly, channels 274b, 274c and 274dprovide respective signals f_(bt) and f_(bp), f_(ct) and f_(cp), andf_(dt) and f_(dp) to processor 298.

Processor 298 implements either a curve fitting routine or a look-uptable and interpolation routine to determine the temperature correctedpressure. In either case, the initial step is to measure both the f_(t)and f_(p) signals at selected pressures over the required operatingrange of temperatures. These values can then be used either to derivethe coefficients of the selected curve fitting expression or todetermine individual entries for a look-up table at each of the selectedtemperatures.

In implementating the curve fitting technique, the oscillators of eachflat are calibrated to provide respectively a pressure measurement as afunction of frequency and temperature and a temperature measurement as afunction of frequency and pressure. Typical two-dimensional calibrationpolynomials for pressure and temperature measurements have the form ofequations (4) and (6). The two oscillators associated with flat 272a arerepresentative of the oscillator pairs associated with flats 272b, 272cand 272d. During calibration, the operating frequencies of the twooscillators on flat 272a which provide respectively f_(at) and f_(ap)are measured over a broad range of selected pressures and temperatures,and the coefficients of the polynomial T(f,P) for the oscillatorproviding f_(at) and the coefficients of the polynomial P(f,T) for theoscillator providing f_(ap) are determined using a parameter estimationtechnique, such as for example the least squares parameter estimationwhich is described in the Mendel reference. During the measurementphase, an approximate measure of temperature is obtained from f_(at)using the approximation:

    T(f)=A.sub.T f+B.sub.T f.sup.2 +C.sub.T f.sup.3 +D.sub.T   (13)

derived from equation (6). The approximate value of temperature is usedin equation (4) along with f_(ap) to determine a best estimate pressure.The technique may be applied iteratively by using this best pressureestimate with f_(at) in equation (6) and the resulting best temperatureestimate with f_(ap) in equation (4) until the results for pressure andtemperature appropriately converge.

In implementing the look-up table technique, during the calibrationphase the signal of interest is measured over a range of selectedpressures and temperatures, and the values thereby obtained are storedinto a three dimensional table of pressure, f_(at), and f_(ap). Duringthe measurement phase, the pressure measurement is determined fromconsulting the look-up table and if necessary using a suitableinterpolation technique for three variables, such as discussed in theKunz reference cited above and which is incorporated herein by referencethereto.

Although the measurement correction compensation technique is describedherein in the context of a single flat, the technique may also be usedwhere oscillators on respective flats or other regions of the diaphragmrespectively have a temperature orientation and a pressure orientation.As applied to the embodiment of FIGS. 1-3 and 4-5, for example, flats 2aand 2b would have a "ST" orientation with γ=0° for sensing pressurewhile two additional flats of the same thickness as flats 2a and 2b buthaving a "SST" orientation with γ=0° for sensing temperature would beprovided as described above.

While the invention has been described with reference to particularembodiments, it is to be appreciated that the embodiments areillustrative and that the invention is not intended to be limited toonly the disclosed embodiments. Variations within the spirit and scopeof the invention will occur to those skilled in the art. For example,while the temperature induced frequency shifts for a SAW devicefabricated on a diaphragm housed within a compliant structureessentially depend on the crystallographic orientation, the pressureinduced frequency shifts are strongly dependent on such otherconsiderations as the detailed geometry of the diaphragm structure, theend cap design, and the loading configuration, as well as on theselected orientation. Accordingly, variations in these and other suchfactors are contemplated and are within the scope of the presentinvention.

What is claimed is:
 1. A surface acoustic wave signal frequencyapparatus comprising a crystalline diaphragm section having acylindrical or spherical outer surface and a cylindrical or sphericalinner surface, wherein:one of said outer and inner surfaces is adaptedfor subjection to an applied pressure; the other of said outer and innersurfaces includes a first area thereof adapted for the fabrication of asurface acoustic wave device, said first area having a selectedorientation having, for a selected propagation direction, a highsensitivity to pressure effects and a low sensitivity to temperatureeffects; and said other surface further includes a second area thereofadapted for the fabrication of a surface acoustic wave device, saidsecond area having a selected orientation having, for a selectedpropagation direction, a low sensitivity to pressure effects and a highsensitivity to temperature effects.
 2. A signal frequency apparatus asin claim 1 wherein said diaphragm section has a continuous crystallattice structure.
 3. A signal frequency apparatus as in claim 2 whereinthe orientation of said first area, the propagation direction for saidfirst area, the orientation of said second area, and the propagationdirection for said second area are selected from the group consisting ofvalues in the neighborhood of:SST orientation, 0°, ST orientation, 0°;SST orientation, 21.5°. ST orientation, 35°; SST orientation, 0°, SSTorientation, 21.5°; and ST orientation, 35°, ST orientation, 0°.
 4. Asignal frequency apparatus as in claim 1 wherein:said other surfacefurther includes a third area thereof adapted for the fabrication of asurface acoustic wave device, said third area having a selectedorientation having, for a selected propagation direction, a highsensitivity to pressure effects and a low sensitivity to temperatureeffects; and said other surface further includes a fourth area thereofadapted for the fabrication of a surface acoustic wave device, saidfourth area having a selected orientation having, for a selectedpropagation direction, a low sensitivity to pressure effects and a highsensitivity to temperature effects.
 5. A signal frequency apparatus asin claim 4 wherein said diaphragm section has a continuous crystallattice structure.
 6. A surface acoustic wave signal frequency apparatuscomprising a crystalline diaphragm section having a cylindrical orspherical outer surface and a cylindrical or spherical inner surface,wherein:one of said outer and inner surfaces is adapted for subjectionto an applied pressure; the other of said outer and inner surfacesincludes a first area thereof adapted for the fabrication of a surfaceacoustic wave device, said first area having a selected crystal latticearrangement having, for a selected propagation direction, a highsensitivity to pressure effects and a low sensitivity to temperatureeffects; and said other surface further includes a second area thereofadapted for the fabrication of a surface acoustic wave device, saidsecond area having a selected crystal lattice arrangement having, for aselected propagation direction, a low sensitivity to pressure effectsand a high sensitivity to temperature effects.
 7. A signal frequencyapparatus as in claim 6 wherein said diaphragm section has a continuouscrystal lattice structure.
 8. A signal frequency apparatus as in claim 7wherein the crystal lattice arrangement of said first area, thepropagation direction for said first area, the orientation of saidsecond area, and the propagation direction for said second area areselected from the group consisting of values in the neighborhood of:SSTorientation, 0°, ST orientation, 0°; SST orientation, 21.5°. STorientation, 35°; SST orientation, 0°, SST orientation, 21.5°; and STorientation, 35°, ST orientation, 0°.
 9. A signal frequency apparatus asin claim 6 wherein:said other surface further includes a third areathereof adapted for the fabrication of a surface acoustic wave device,said third area having a selected crystal lattice arrangement having,for a selected propagation direction, a high sensitivity to pressureeffects and a low sensitivity to temperature effects; and said othersurface further includes a fourth area thereof adapted for thefabrication of a surface acoustic wave device, said fourth area having aselected crystal lattice arrangement having, for a selected propagationdirection, a low sensitivity to pressure effects and a high sensitivityto temperature effects.
 10. A signal frequency apparatus as in claim 9wherein said diaphragm section has a continuous crystal latticestructure.
 11. A surface acoustic wave signal frequency apparatuscomprising a crystalline diaphragm section having a cylindrical orspherical outer surface and a cylindrical or spherical inner surface,wherein:one of said outer and inner surfaces is adapted for subjectionto an applied pressure; the other of said outer and inner surfacesincludes a first area thereof adapted for the fabrication of a surfaceacoustic wave device, said first area having a selected contour and aselected displacement from a reference axis normal to the longitudinalaxis thereof for providing, for a selected propagation direction, a highsensitivity to pressure effects and a low sensitivity to temperatureeffects; and said other surface further includes a second area thereofadapted for the fabrication of a surface acoustic wave device, saidsecond area having a selected orientation having, for a selected contourand a selected displacement from a reference axis normal to thelongitudinal axis thereof for providing, a low sensitivity to pressureeffects and a high sensitivity to temperature effects.
 12. A signalfrequency apparatus as in claim 11 wherein said diaphragm section has acontinuous crystal lattice structure.
 13. A signal frequency apparatusas in claim 12 wherein the contour of said first and second areas isflat, and wherein the displacement of said first area, the propagationdirection for said first area, the displacement of said second area, andthe propagation direction for said second area are selected from thegroup consisting of values in the neighborhood of: -49. 2°, 0°, 40°,0°;-49.2°, 21.5°, 40°, 35°; -49.2°, 0°, -49.2°, 21.5°; and 40°, 35°,40°, 0°.
 14. A signal frequency apparatus as in claim 11 wherein:saidother surface further includes a third area thereof adapted for thefabrication of a surface acoustic wave device, said third area having aselected contour and a selected displacement from a reference axisnormal to the longitudinal axis thereof for providing, for a selectedpropagation direction, a high sensitivity to pressure effects and a lowsensitivity to temperature effects; and said other surface furtherincludes a fourth area thereof adapted for the fabrication of a surfaceacoustic wave device, said fourth area having a selected contour and aselected displacement from a reference axis normal to the longitudinalaxis thereof for providing, for a selected propagation direction, a lowsensitivity to pressure effects and a high sensitivity to temperatureeffects.
 15. A signal frequency apparatus as in claim 14 wherein saiddiaphragm section has a continuous crystal lattice structure.